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Nanoscaled Reference Materials Home | nano-refmat.bam.de Reviews
https://nano-refmat.bam.de
reference materials
Nanoscaled Reference Materials Home | Category: Lateral (X-Y-axis, 1-dim)
http://www.nano-refmat.bam.de/en/category_06_lateral_x-y-axis_1-dim.htm
Category: Lateral (X-Y-axis, 1-dim). Nanoscale stripe pattern for testing of lateral resolution. 35, 14.2, 19.5, 38, 96, ., 691, 986, 4642 nm and calibration of length scale. Cross section of C-W multilayer. 80, 100, 115, 130, . Calibration of length expansion scale on SEM. Surface Topography Standards (STS). Gratings with near perfect periodicity combination of step height and pitch. 18, 44, 100, 180. 100 nm pitch standard. Surface Topography References (STR). 18, 44, 100, 180. Dr rer. nat.
Nanoscaled Reference Materials IEC/TC 113
http://www.nano-refmat.bam.de//en/iec_tc_113/index.htm
Nanoscaled Reference Materials Home | Category: Porosity
http://www.nano-refmat.bam.de/en/category_12_porosity.htm
Median micropore width : 0.67 nm. Adsorption of Ar gas at the temperature of liquid Argon (87 K). Zeolite (linde type A). Median micropore width : 0.59 nm. Successor material for BAM-PM-103). Dr rer. nat. Unter den Eichen 44-46.
Nanoscaled Reference Materials Home | Category: Lateral (X-Y-axis, 2-dim)
http://www.nano-refmat.bam.de/en/category_07_lateral_x-y-axis_2-dim.htm
Category: Lateral (X-Y-axis, 2-dim). 2-dim lattice of inverted square pyramids, 200 nm pitch, etched into a silicon chip. Line width; 50, 100, 150, . 50, 100, 150. 25, 45, 70, 110. 25, 45, 70, 110. NanoLattice pitch standard (NLSM). NanoLattice pitch standard (NLSM). It consists of two direction rulers. Dr rer. nat. Unter den Eichen 44-46.
Nanoscaled Reference Materials Home | Category: Single step
http://www.nano-refmat.bam.de/en/category_03_single_step.htm
Step chip material: Silicon. To calibrate the height of an AFM instrument or estimate the instrument s step height. Standard sample for height. Grooves etched in silicon. Surface Topography Standards (STS):. Gratings with near perfect periodicity combination of step height and pitch. 18, 44, 100, 180. NanoLattice (TM) (NLSM) 100 nm pitch standard. Surface Topography References (STR):. 18, 44, 100, 180. Surface Topography References (STR). Dr rer. nat. Unter den Eichen 44-46.
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Nanostandards | I forgot my password
http://nanostandards.ansi.org/tiki-remind_password.php
I forgot my password. I forgot my password. Links to Relevant Activities. BAM NanoScale Reference Materials Database. IEC TC 113 Nanotechnology standardization for electrical and electronic products and systems. ISO TC 229 Nanotechnologies. Quick Edit a Wiki Page. ANSI-NSP December 2016 Newsletter. ANSI-NSP September 2016 Newsletter. ANSI-NSP June 2016 Newsletter. ANSI-NSP March 2016 Newsletter. ANSI-NSP November 2015 Newsletter. ANSI-NSP July 2015 Newsletter. ANSI-NSP April 2015 Newsletter.
Nanostandards | Welcome to the ANSI-NSP Nanotechnology Standards Database
http://nanostandards.ansi.org/index.php
I forgot my password. The American National Standards Institute's Nanotechnology Standards Panel (ANSI-NSP). Serves as the cross-sector coordinating body for the purposes of facilitating the development of standards in the area of nanotechnology including, but not limited to, nomenclature/terminology; health, safety and environmental aspects; materials properties; and testing, measurement and characterization procedures. Nanotechnology, as defined by ISO/TC 229 Nanotechnologies, is the application of sci...
Nanostandards | Welcome+to+the+ANSI-NSP+Nanotechnology+Standards+Database
http://nanostandards.ansi.org/tiki-print.php?page=Welcome+to+the+ANSI-NSP+Nanotechnology+Standards+Database
I forgot my password. Page cannot be found. Return to home page. Links to Relevant Activities. BAM NanoScale Reference Materials Database. IEC TC 113 Nanotechnology standardization for electrical and electronic products and systems. ISO TC 229 Nanotechnologies. Quick Edit a Wiki Page. ANSI-NSP December 2016 Newsletter. ANSI-NSP September 2016 Newsletter. ANSI-NSP June 2016 Newsletter. ANSI-NSP March 2016 Newsletter. ANSI-NSP November 2015 Newsletter. ANSI-NSP July 2015 Newsletter.
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Nanoscaled Reference Materials Home
Cooperation with ISO/TC 229 Nanotechnologies. Reference materials are the key to guaranteeing realiability and correctness for results of chemical analyses and technical measurements. List* of currently available nanoscaled reference materials. Certified Reference Material (CRM). Quality Control Materials (QCM). Reference Material (RM* ). List does not claim to be exhaustive. RM = Reference material NOT specified as CRM or QCM. Lateral X-Y-axis, 1-dim. Lateral X-Y-axis, 2-dim. Information on this website.
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