4dimensions.com
Four Dimensions Inc.Four Dimensions, Four Dimensions Inc., 4 dimensions, wafer metrology,
http://www.4dimensions.com/
Four Dimensions, Four Dimensions Inc., 4 dimensions, wafer metrology,
http://www.4dimensions.com/
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Four Dimensions, Inc.
3138 ●●●●● Ave.
Ha●●rd , California, 94545
United States
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Four Dimensions, Inc.
3138 ●●●●● Ave.
Ha●●rd , California, 94545
United States
View this contact
Hurricane Electric
Hurricane Electric
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Four Dimensions Inc. | 4dimensions.com Reviews
https://4dimensions.com
Four Dimensions, Four Dimensions Inc., 4 dimensions, wafer metrology,
4dimensions.com
Four Dimensions Inc.
http://4dimensions.com/product.html
Four Dimensions' product line consists of needle four point probe systems and mercury probing systems. Four point probe systems are for sheet resistivity measurements on a huge variety of materials including group-IV semiconductors, metals, and compound semiconductors, as well as new materials found in flat panel displays and hard disks. We offer conventional needle as well as Mercury four point probes. 1) Four-Point Probe System. We offer precise four point probe head with special needle array, such as ...
Four Dimensions Inc.
http://4dimensions.com/services.html
Four Dimensions offers measurement service and our scientific expertise to analyze your samples using our metrology tools. Sheet Resistance / Resistivity / Thickness measurements using needle or Mercury four point probes. See application chart. Current Voltage (I-V) and Capacitance Voltage (C-V) measurements using our Mercury probing station. See application chart. Service available up to 300 mm (12) wafers. Drop-in or mail service available. Scientific evaluation of the results available.
Four Dimensions Inc.
http://4dimensions.com/index.html
Four Dimensions manufactures advanced semiconductor probing systems since 1978. Our Four Point Probe and CVmap systems are found in hundreds of fabs and research institutions around the world. We provide four point probes. With an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four point probe for measuring pn junction leakage and sheet resistivity in the same probing step meeting the requirements for ultra shallow junction probing.
Four Dimensions Inc.
http://4dimensions.com/about.html
About Four Dimensions Inc. Four Dimensions is a California incorporation and has its principal office in Hayward, California. July 15-17, 2008, Semicon West. San Francisco, North Hall 6147. 2008: We celebrate our 30 year anniversary! 2008: Four Dimensions introduces a new way to characterize ultra-shallow junctions (USJ) by corrected CV-plotting. This technique is an extencion of our CVmap systems. 2005: Four Dimensions is introducing CV92M. A non-mapping basic version of their CVmap Mercury probe system...
Four Dimensions Inc.
http://4dimensions.com/sales.html
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科宇系統有限公司
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Active Link System Corp. 31616;体中文. PSI 442-PMI MANUAL PHOTOMASK INSPECTION. PSI 462-PMI PHOTOMASK INSPECTION. Photomask Visual Inspection/Review Station. PSI 600LS Manual 300mm WAT Probe Station. PSI S500 SEMI-AUTOMATIC PROBE STATION. PSI 400/ 410 Quick Position Manual Probe Station. PSI 404LS / 414LS. PSI 400LS / 410LS Precision Lead Screw Positioning. Jandel 4PP - 四點探針頭 (Four Point Probe Heads). Wet Series - Wet Chemistry Process monitoring systems. WetCon - Conductive Concentration Analyser.
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Active Link System Corp. 31616;体中文. Four Dimensions, Inc.
科宇系統有限公司
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Active Link System Corp. 31616;体中文. PSI 600LS Manual 300mm WAT Probe Station. PSI 600LS Manual 300mm Wafer Probe Station 適用12 吋之晶圓WAT 應用，具有低漏電流(fA)及高精密度( 0.1μm)。 量測搭配精密馬達驅動X-Y Stage解析度為 0.1um。 PSI S500 SEMI-AUTOMATIC PROBE STATION. PSI S500 SEMI-AUTOMATIC PROBE STATION 操作容易的半自動探針台，可同時放置10組以上探針座進行量測使用Pendant (keypad)或Joystick操作，可透過RS232介面傳輸指令。 可配合National Instruments的Labview 軟體或Alliance Technology的Metrics ICS 進行量測。 PSI 400/ 410 Quick Position Manual Probe Station. PSI 400平台Z軸具有3個定位點， PSI 410 顯微鏡Z軸具有12個定位點。
科宇系統有限公司
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Active Link System Corp. 31616;体中文. 英文名稱 Active Link System Corp. 公司網站 http:/ www.activelink.com.tw. 科宇系統代理歐美半導體與光電產業的專業量測分析系統，包括微米、納米級物體表面的三維精密測量儀、濕製程濃度分析儀、光罩檢查機、探針台、CV / IV 量測系統、薄膜和片電阻的測量儀、以及太陽電池製程中的片電阻與漏電流量的量測等機台和周邊耗材。 3D Optical microscope/Non-contact Surface profiler. In-line, real-time concentration monitor. 化學液濃度分析儀， 濕製程多通道即時濃度監測系統適用於清洗(Clean)、蝕刻(Etch)、去光阻(Strip)等化學槽監測，如半導體製程SC1、SC2、BOE、DHF、EKC、ACT 光電產業Al etch、BOE、PR STRIPPER 太陽能廠裡製程中的HF/HNO3、KOH/IPA等化學液濃度監控，依據不同的需求有不同的選擇。 Hg CV Mapping system.
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Active Link System Corp. 31616;体中文. Four Dimensions, Inc.
科宇系統有限公司
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Active Link System Corp. 31616;体中文. PSI 1920H HORIZONTAL SIGNAL INTEGRITY TDR PROBE S. PSI 1920H™ HORIZONTAL SIGNAL INTEGRITY TDR PROBE STATION MULTIPLE CIRCUIT BOARD CONFIGURATIONS 適用平面顯示器(flat panel displays)或高密度印刷電路板(high density populated PCB)進行電性量測或時域測試(Time Domain Testing)。 顯微鏡放大倍率為2.1X to 270X。 Four Dimensions, Inc.
科宇系统有限公司
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Active Link System Corp. 27491;體中文. 英文名称 Active Link System Corp. 公司网站 http:/ www.activelink.com.tw. 科宇系统代理欧美半导体与光电产业的专业量测分析系统，包括微米、纳米级物体表面的三维精密测量仪、湿制程浓度分析仪、光罩检查机、探针台、CV / IV 量测系统、薄膜和片电阻的测量仪、以及太阳电池制程中的片电阻与漏电流量的量测等机台和周边耗材。 3D Optical microscope/Non-contact Surface profiler. In-line, real-time concentration monitor. 化学液浓度分析仪， 湿制程多通道即时浓度监测系统适用於清洗(Clean)、蚀刻(Etch)、去光阻(Strip)等化学槽监测，如半导体制程SC1、SC2、BOE、DHF、EKC、ACT 光电产业Al etch、BOE、PR STRIPPER 太阳能厂里制程中的HF/HNO3、KOH/IPA等化学液浓度监控，依据不同的需求有不同的选择。 Hg CV Mapping system.
科宇系統有限公司
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Active Link System Corp. 31616;体中文. Mercury Probe CVmap Applications. Mercury Probe CVmap Applications. Cd (square wave deep pulse). Cq (square wave quasi static). Ch (square wave high frequency). Sinusoidal Ch (Agilent 4192A, 4285 A, Keithley 590). Current range 10fA to 1mA, Voltage range up to /-100V. Extended Voltage range /- 1000V (Keithley 2410, 237). Multi terminal IV curves (pseudo MOST technique). Silicon: Oxide and gate material (low k, high k) characterization and integrity monitoring. Electron...
科宇系統有限公司
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Active Link System Corp. 31616;体中文. PSI 442-PMI MANUAL PHOTOMASK INSPECTION. PSI 462-PMI PHOTOMASK INSPECTION. PSI 462 PMI手動光罩檢驗機提供DRO (Digital Readout)數位座標判讀系統，可重複進行缺陷定位與檢驗，是量測與故障分析的最佳利器。 Photomask Visual Inspection/Review Station. Photomask Visual Inspection/Review Station PSI生產之光罩檢驗機提供客戶最完善且更具經濟效益的解決方案，讓客戶能偵測、檢驗各種先進光罩上的缺陷，改進生產與品管的效率。 PSI 400 系列適用於 4" 9" 光罩. PSI 300 系列適用於 4" 7" 光罩. 362-PMI 提供DRO( Digital Readout)數位座標判讀系統. Four Dimensions, Inc.
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COLLABORATE TO SHARE VALUE. The team of 4dimensions. Supports organisations in the shaping of their working culture. The building up of trust. And the creation of spaces of performance. In our research based consulting work we measure the effectiveness. Of the given corporate culture and structure. Through our research activities we provide new and useful insights for entrepreneurial agency. For us, consulting means to care for development. And, by doing so, sustainably. Ensure your corporate success.
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4 Dimensions
Information Technology and Consultancy Service Provider that can deliver measurable business results. We provide customers with solutions and professional services that conform exactly to their needs and expectations. 4Dimensions helps you use technology strategically to grow your business, reduce costs, and manage effectively. Information Technology and Consultancy Service Provider that can deliver measurable business results.
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Four Dimensions Inc.
Four Dimensions manufactures advanced semiconductor probing systems since 1978. Our Four Point Probe and CVmap systems are found in hundreds of fabs and research institutions around the world. We provide four point probes. With an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four point probe for measuring pn junction leakage and sheet resistivity in the same probing step meeting the requirements for ultra shallow junction probing.
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