ALTOINSPECTION.COM

Alto- An inspection company for wafers, sapphire, glass, MEMS, thin wafer

中文 An inspection company. In-Line Wafer Surface Defect Inspection. You can now inspect 100% surface defect on sapphire and quartz wafers. Only 10 seconds needed to read one 4" wafer with a 5 micron resolution. For measuring the TTV of warped and sagged wafer, Alto offers the automatic handling and inspeciton solution. To monitor your conductive film thickness, check out our 49-point probing? Surface Defect Unpatterned Wafers. Measuring wafer thickness, TTV and other parameters are never this easy.

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Alto- An inspection company for wafers, sapphire, glass, MEMS, thin wafer | altoinspection.com Reviews

<META> DESCRIPTION

中文 An inspection company. In-Line Wafer Surface Defect Inspection. You can now inspect 100% surface defect on sapphire and quartz wafers. Only 10 seconds needed to read one 4 wafer with a 5 micron resolution. For measuring the TTV of warped and sagged wafer, Alto offers the automatic handling and inspeciton solution. To monitor your conductive film thickness, check out our 49-point probing? Surface Defect Unpatterned Wafers. Measuring wafer thickness, TTV and other parameters are never this easy.

<META> KEYWORDS

1 surface

2 film

3 news

4 turbo

5 wafer geometry

6 profiling the wafer

7 film thickness

8 for copper layer

9 profiling fragile wafers

10 monitoring for spc

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surface,film,news,turbo,wafer geometry,profiling the wafer,film thickness,for copper layer,profiling fragile wafers,monitoring for spc

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Alto- An inspection company for wafers, sapphire, glass, MEMS, thin wafer | altoinspection.com Reviews

https://altoinspection.com

中文 An inspection company. In-Line Wafer Surface Defect Inspection. You can now inspect 100% surface defect on sapphire and quartz wafers. Only 10 seconds needed to read one 4" wafer with a 5 micron resolution. For measuring the TTV of warped and sagged wafer, Alto offers the automatic handling and inspeciton solution. To monitor your conductive film thickness, check out our 49-point probing? Surface Defect Unpatterned Wafers. Measuring wafer thickness, TTV and other parameters are never this easy.

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altoinspection.com

1

Repair

http://www.altoinspection.com/spc.html

中文 An inspection company. For Statistic Process Control (SPC). Thanks to our advanced data analysis function and easy-to-view user interface, you can implement SPC with very little extra work. Our monitoring solution is designed to improve the tracking the defect and can be easily correlated with your manufacturing parameters for root-cause analysis. Customizable layout and parameter; all relevant info in a single view; OK-NG indicator via traffic light ; Global Event and Defect counter.

2

News

http://www.altoinspection.com/news.html

中文 An inspection company. Ultra High Speed Unpatterned Wafer Defect Inspection Tool. Santa Clara, Calif., Dec. 4, 2012- Alto Inspection today announced its next-generation in-line unpatterned wafer inspection tool, the ALTO SD-6000. Developed specifically for transparent wafers surface inspection, the ALTO SD-6000 also provides the highest throughput available in the market to meet the growing integrated inspection demand. The ALTO-SD-6000 is the best choice for sapphire, quartz, compound, micro-electro-...

3

In-Line Wafer Surface Defect Inspection-for silicon, quartz, sapphire, compound and MEMS wafers

http://www.altoinspection.com/surface.html

中文 An inspection company. In-Line Wafer Surface Defect Inspection. ALTO-SD-150/200 For Transperent Wafers. ALTO-SD series is an In-line inspection system supplying high throughput, full surface defect inspection for all kinds of wafers including silicon, quartz, sapphire, compound and MEMS wafers. High-resolution camera optics plus LED illumination guarantee reliable detection of all local defects. It inspects defect size of 1 10 microns, configurable inspection resolution to optimize defect size...This ...

4

Alto- An inspection company for wafers, sapphire, glass, MEMS, thin wafer

http://www.altoinspection.com/index.html

中文 An inspection company. In-Line Wafer Surface Defect Inspection. You can now inspect 100% surface defect on sapphire and quartz wafers. Only 10 seconds needed to read one 4" wafer with a 5 micron resolution. For measuring the TTV of warped and sagged wafer, Alto offers the automatic handling and inspeciton solution. To monitor your conductive film thickness, check out our 49-point probing? Surface Defect Unpatterned Wafers. Measuring wafer thickness, TTV and other parameters are never this easy.

5

Repair

http://www.altoinspection.com/ttv.html

中文 An inspection company. Wafer Thickness, TTV, Bow and Warpage. Handles 25 micron wafers. ALTO-TTV family offers the speedy measurement of wafer geometry parameter, more importantly, we can automate the tool to handle from thin wafers to perforated, warped, bumped, and tape-framed wafers. optional sorter and shipping jar unpacking function available. Non-contact, high reliability measurement. From Si, sapphire, to compound wafers. Wafer thickness, Total thickness variations. Warp, bow, sag.

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Alto- An inspection company for wafers, sapphire, glass, MEMS, thin wafer

中文 An inspection company. In-Line Wafer Surface Defect Inspection. You can now inspect 100% surface defect on sapphire and quartz wafers. Only 10 seconds needed to read one 4" wafer with a 5 micron resolution. For measuring the TTV of warped and sagged wafer, Alto offers the automatic handling and inspeciton solution. To monitor your conductive film thickness, check out our 49-point probing? Surface Defect Unpatterned Wafers. Measuring wafer thickness, TTV and other parameters are never this easy.

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