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Probe Card Test and Analysis. Probe Card Test and Analysis. Div" data-cycle-timeout="5500" data-cycle-pager=".cycle-pager". Rudolph Technologies' expanding portfolio of equipment and software solutions includes macro defect inspection,. Probe card test and analysis, thin film metrology, and most recently, advanced packaging lithography systems. May 1, 2015. Rudolph Technologies to Participate in Two Investor Conferences. The B Riley and Co. 16th Annual Investor Conference; and. April 27, 2015.

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Probe Card Test and Analysis. Probe Card Test and Analysis. Div data-cycle-timeout=5500 data-cycle-pager=.cycle-pager. Rudolph Technologies' expanding portfolio of equipment and software solutions includes macro defect inspection,. Probe card test and analysis, thin film metrology, and most recently, advanced packaging lithography systems. May 1, 2015. Rudolph Technologies to Participate in Two Investor Conferences. The B Riley and Co. 16th Annual Investor Conference; and. April 27, 2015.

<META> KEYWORDS

1 semiconductor

2 defect inspection

3 advanced packaging lithography

4 thin film metrology

5 yield management software

6 process control software

7 equipment control software

8 manufacturing software

9 flat panel display

10 display lithography

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semiconductor,defect inspection,advanced packaging lithography,thin film metrology,yield management software,process control software,equipment control software,manufacturing software,flat panel display,display lithography,data storage,compound semi,news

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Home - Rudolph Technologies | augusttech.com Reviews

https://augusttech.com

Probe Card Test and Analysis. Probe Card Test and Analysis. Div" data-cycle-timeout="5500" data-cycle-pager=".cycle-pager". Rudolph Technologies' expanding portfolio of equipment and software solutions includes macro defect inspection,. Probe card test and analysis, thin film metrology, and most recently, advanced packaging lithography systems. May 1, 2015. Rudolph Technologies to Participate in Two Investor Conferences. The B Riley and Co. 16th Annual Investor Conference; and. April 27, 2015.

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augusttech.com

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Process Control Software - Rudolph Technologies

http://www.augusttech.com/products/compound-semi/process-control-software

Probe Card Test and Analysis. Probe Card Test and Analysis. Products / Process Control Software. For compound semi manufacturing. Optimize manufacturing processes; improve profitability. A wide range of Rudolph process control software including run-to-run control, fault detection and classification and process modeling provides the manufacturing control required to reduce costs, eliminate waste and improve productivity. Fault detection and intelligent analytics for process and equipment control.

2

Defect Inspection - Rudolph Technologies

http://www.augusttech.com/products/led/defect-inspection

Probe Card Test and Analysis. Probe Card Test and Analysis. Products / Defect Inspection. For the LED industry. As the illumination industry transitions from incandescent illumination to more power-efficient Light Emitting Diodes (LED), manufactures must aggressively reduce product cost and increase wavelength consistency and quality to capture market share. Automated defect inspection for MEMS, LED and Semiconductors. Inspection Boosts HB LED Yields. Probe Card Test and Analysis.

3

Equipment Control Software - Rudolph Technologies

http://www.augusttech.com/products/semiconductor/equipment-control-software

Probe Card Test and Analysis. Probe Card Test and Analysis. Products / Equipment Control Software. For nearly 20 years, Rudolph’s full-featured, commercially supported equipment control has provided timely delivery of products to market and helped to minimize development and maintenance costs. And yield management software. Providing an open, object-oriented development environment. Equipment Control Software Products. Probe Card Test and Analysis. Probe Card Test and Analysis.

4

Defect Inspection - Rudolph Technologies

http://www.augusttech.com/products/rd/defect-inspection

Probe Card Test and Analysis. Probe Card Test and Analysis. Products / Defect Inspection. For research and development. Cost-effective inspection and metrology for lower volume applications including research institutes, equipment vendors and consortia. Research, testing and prototyping are important steps in bringing new technologies to the semiconductor manufacturing floor. Inspection and metrology solutions for. Pattern / bare wafer. Chip tray (waffle / gelpack). Probe Card Test and Analysis.

5

Yield Management Software - Rudolph Technologies

http://www.augusttech.com/products/semiconductor/yield-management-software

Probe Card Test and Analysis. Probe Card Test and Analysis. Products / Yield Management Software. With over twenty years of experience in yield management, Rudolph offers the yield analysis, data management, and defect classification solutions that have proven to be a critical part of controlling yield in the semiconductor and related industries. In fact, Rudolph was first to market with "all-surface" defect analysis and is now installed in forty plus semiconductor, HDD, LED. Solar, and flat panel.

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Home - Rudolph Technologies

Probe Card Test and Analysis. Probe Card Test and Analysis. Div" data-cycle-timeout="5500" data-cycle-pager=".cycle-pager". Rudolph Technologies' expanding portfolio of equipment and software solutions includes macro defect inspection,. Probe card test and analysis, thin film metrology, and most recently, advanced packaging lithography systems. May 1, 2015. Rudolph Technologies to Participate in Two Investor Conferences. The B Riley and Co. 16th Annual Investor Conference; and. April 27, 2015.

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