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Calibration Standards | analytical electron microscopy standards and accessories for forensic and general applications

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. Calibration standards / calibration stubs. 8211; EDS, BSD, microValidator standards covering a wide range of metals and alloys for all common electron microscopes including FEI, Hitachi, Jeol …. Reference standards / reference stubs. 8211; for particle and phase analysis, cathodoluminescence, polymorphs and minerals. Uarr; Top of page.

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Calibration Standards | analytical electron microscopy standards and accessories for forensic and general applications | calibrationstandards.net Reviews

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Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. Calibration standards / calibration stubs. 8211; EDS, BSD, microValidator standards covering a wide range of metals and alloys for all common electron microscopes including FEI, Hitachi, Jeol …. Reference standards / reference stubs. 8211; for particle and phase analysis, cathodoluminescence, polymorphs and minerals. Uarr; Top of page.

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Calibration Standards | analytical electron microscopy standards and accessories for forensic and general applications | calibrationstandards.net Reviews

https://calibrationstandards.net

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. Calibration standards / calibration stubs. 8211; EDS, BSD, microValidator standards covering a wide range of metals and alloys for all common electron microscopes including FEI, Hitachi, Jeol …. Reference standards / reference stubs. 8211; for particle and phase analysis, cathodoluminescence, polymorphs and minerals. Uarr; Top of page.

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Services | Calibration Standards

http://calibrationstandards.net/products/analytical-sem-services

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. A general SEM imaging or microanalysis service is available. The system is available as either self-drive or with a expert operator. Charges are based on either a daily, or weekly rate. Equipment available 30 kV ESEM with 150×150 mm stage, EDS X-ray spectrometer, sample preparation equipment. Price On Demand : Please contact Ardennes Analytique. Tags : Analysis, Service.

2

Software | Calibration Standards for analytical and forensic electron microscopy

http://calibrationstandards.net/products/analytical-sem-software

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. GSR Magnum Emulator (single user). GSR Emulator allows you to review run data off line and remotely from the electron microscope. It also allows modification of class definitions and subsequent automatic reclassification of run data. The program is also useful for training new users of GSR SEM technique. For FEI, Tescan, Zeiss microscopes. GSR Magnum Emulator (1-5 users).

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Products – Quality and Services | Calibration Standards

http://calibrationstandards.net/products

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. Products – Quality and Services. Our products are manufactured under carefully controlled conditions in our laboratories. Before shipping, all products are tested using electron microscopes and X-ray analysers in our own laboratories. Standards can be manufactured to specific customer request, provided we can obtain the components and they can easily be polished.

4

Accessories | Calibration Standards for analytical electron microscopy

http://calibrationstandards.net/products/analytical-sem-accessories

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. Allows samples to be held in their positions while in storage, permitting particles or areas of interest to be easily relocated when reinserted into the SEM. Comprises the relocation pedestal, central location screw and calibration stub mount, 1x 20 hole top plate. Accommodates Agar 12.7 mm pin stubs. For FEI, Zeiss microscopes. Dual-Axis Motorized Comparison Substage.

5

Mineral samples for analytical electron microscopy | Calibration Standards

http://calibrationstandards.net/products/mineral-samples-for-analytical-electron-microscopy

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. Mineral samples for analytical electron microscopy. Samples of the following important minerals are available from calibrationstandards.net. These samples can be prepared on custom stubs to order. Please contact us for further details. Olary, South Australia. Ca,Si,O,H. Ca,Mg,O,H,As. Adula Mts, St Gothard Massif, Ticino Region, Switzerland. K,Al,Si,O. Na,Al,Si,O. Be,Al,...

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Calibration Standards | analytical electron microscopy standards and accessories for forensic and general applications

Analytical electron microscopy standards and accessories for forensic and general applications. Uarr; Menu and cart. Terms & Conditions. Calibration standards / calibration stubs. 8211; EDS, BSD, microValidator standards covering a wide range of metals and alloys for all common electron microscopes including FEI, Hitachi, Jeol …. Reference standards / reference stubs. 8211; for particle and phase analysis, cathodoluminescence, polymorphs and minerals. Uarr; Top of page.

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