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Electron Microscopy Ireland specialist in SEM, TEM, FIB & XPS analysis: NIMAC

Welcome to the Nano Imaging and Material Analysis Centre (NIMAC) specialists in providing Scanning and Transmission Electron Microscopy (SEM, TEM) and state-of-the-art analytical techniques, training and services to industry. NEWS - Innovation Vouchers. Clients can utilize innovation vouchers ( Link. To access the skills and research expertise in NIMAC. Please contact NIMAC for further information. Transmission Electron Microscopy ( TEM. Dual Beam FIB ( DB-FIB. Focused Ion Beam ( FIB. Circuit Edits ( Link.

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Electron Microscopy Ireland specialist in SEM, TEM, FIB & XPS analysis: NIMAC | electronmicroscopy.ie Reviews
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Welcome to the Nano Imaging and Material Analysis Centre (NIMAC) specialists in providing Scanning and Transmission Electron Microscopy (SEM, TEM) and state-of-the-art analytical techniques, training and services to industry. NEWS - Innovation Vouchers. Clients can utilize innovation vouchers ( Link. To access the skills and research expertise in NIMAC. Please contact NIMAC for further information. Transmission Electron Microscopy ( TEM. Dual Beam FIB ( DB-FIB. Focused Ion Beam ( FIB. Circuit Edits ( Link.
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3 hr tem analysis
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Electron Microscopy Ireland specialist in SEM, TEM, FIB & XPS analysis: NIMAC | electronmicroscopy.ie Reviews

https://electronmicroscopy.ie

Welcome to the Nano Imaging and Material Analysis Centre (NIMAC) specialists in providing Scanning and Transmission Electron Microscopy (SEM, TEM) and state-of-the-art analytical techniques, training and services to industry. NEWS - Innovation Vouchers. Clients can utilize innovation vouchers ( Link. To access the skills and research expertise in NIMAC. Please contact NIMAC for further information. Transmission Electron Microscopy ( TEM. Dual Beam FIB ( DB-FIB. Focused Ion Beam ( FIB. Circuit Edits ( Link.

INTERNAL PAGES

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1

Sample Submission to Nano Imaging and Material Analysis Centre

http://www.electronmicroscopy.ie/submission.htm

External UCD Clients ( A high priority service is available! Please fill out the Analytical Request Form. And return it along with your samples and any other relevant information to assist in the analysis or processing of samples. Contact ian.reid@ucd.ie. For a quote or information regarding any of the services in the Nano Imaging and Material Analysis Centre.

2

Scanning Electron Microscopy service UK & Ireland - SEM analysis

http://www.electronmicroscopy.ie/sem.htm

Scanning Electron Microscopy (SEM). The most versatile Field Emission Scanning Electron Microscope (FE-SEM) available. High Resolution images of surfaces. Supports many other analytical techniques (FIB, STEM, EDS, WDS, EBSD, CL). 2 Scanning Electron Microscope in house. 11 nm resolution FEG SEM. Large sample capability (6cm in diameter). Wide varietly of sample analysis capabilites.

3

Dual Beam FIB (DB-FIB) service in NIMAC

http://www.electronmicroscopy.ie/dualbeamfib.htm

Dual Beam FIB (DB-FIB). Site specific cross sections and TEM sample prep. Nano size milling and structure deposition. Identification of sub surface defects. Thickness measurements on thin films.

4

Cross Section service in NIMAC

http://www.electronmicroscopy.ie/crosssections.htm

Transmission Electon Microscope's ( TEM. 200KV TEM - 0.21nm Resolution : High Resoultion. 120KV TEM - 0.4nm Resolution : High Contrast. Scanning - TEM (STEM) - 0.7nm Resolution : Cost Effective, Quick. Dual Beam Focused Ion Beam ( DB- FIB. Variable Voltage DualBeam FIB : TEM sample Prep, X-Sections. Focused Ion Beam ( FIB. Variable Voltage DualBeam FIB : TEM sample Prep, X-Sections.

5

Imaging service in NIMAC

http://www.electronmicroscopy.ie/imaging.htm

Scanning Electron Microscope's ( SEM. FEG-SEM (Field Emission Gun- SEM) : High Resoultion. LV-SEM (Low Vacuum SEM) : All Solid materials no coating necessary. E-SEM (Environmental - SEM) : Only system in Ireland - WET samples. Transmission Electon Microscope's ( TEM. 200KV TEM - 0.21nm Resolution : High Resoultion. 120KV TEM - 0.37nm Resolution : High Contrast. Scanning - TEM (STEM) - 0.7nm Resolution : Cost Effective, Quick. Focused Ion Beam ( FIB. Atomic Force Microscope ( AFM.

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Electron Microscopy Ireland specialist in SEM, TEM, FIB & XPS analysis: NIMAC

Welcome to the Nano Imaging and Material Analysis Centre (NIMAC) specialists in providing Scanning and Transmission Electron Microscopy (SEM, TEM) and state-of-the-art analytical techniques, training and services to industry. NEWS - Innovation Vouchers. Clients can utilize innovation vouchers ( Link. To access the skills and research expertise in NIMAC. Please contact NIMAC for further information. Transmission Electron Microscopy ( TEM. Dual Beam FIB ( DB-FIB. Focused Ion Beam ( FIB. Circuit Edits ( Link.

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