ets15.ro
ETS'15 Paper Submission
http://www.ets15.ro/submission.html
IEEE European Test Symposium. May 25-29, 2015. ETS’15 seeks original, unpublished contributions of the following types:. Scientific papers for the Formal Proceedings, presenting novel and complete research work. Contributions for the special track on Emerging Test Strategies (ETS2). ETS’15 also seeks proposals for:. Panels, embedded tutorials, and other special sessions. Vendor presentations focusing on new features of test related products. Fringe workshops, to be held on May 28 and 29.
ets16.nl
Accommodation
http://www.ets16.nl/venue/accommodation
IEEE European Test Symposium. May 23 - 27, 2016. Amsterdam, The Netherlands. The technical sessions will be held at the Mövenpick hotel. A block of rooms has been reserved at the Mövenpick hotel until April 22 at a special rate. Please click here. To access these special rates. We encourage you to make reservations as early as possible. The hotel rooms at the special rate may sell out due to limited availability. Mövenpick Hotel Amsterdam City Centre (* * ). Piet Heinkade 11,. 1019 BR Amsterdam,.
ets16.nl
Regular Papers
http://www.ets16.nl/calls/regular-papers
IEEE European Test Symposium. May 23 - 27, 2016. Amsterdam, The Netherlands. Download the complete pdf version of the call for papers. Each submitted paper should be a complete PDF manuscript, up to six (6) pages (inclusive of all figures, tables, and bibliography) in a standard IEEE format: A4 pages, two columns, single spaced, 10 points Times New Roman font. IEEE template that can be found [ here. Papers not compliant with the IEEE template or exceeding the page limit will be returned without review!
ets16.nl
Travelling
http://www.ets16.nl/venue/travelling
IEEE European Test Symposium. May 23 - 27, 2016. Amsterdam, The Netherlands. Directions to the conference venue. Directions to the conference hotel can be found here. If you want to make use of the public transport in general, please click here. Attendees who need visa for travel to the Netherlands should complete the following form and send email to Said Hamdioui (s.hamdioui@tudelft.nl):. Your full name (first and last names),. Place of issue (passport),. Date of birth,. Place of birth,.
ets16.nl
Program Committee
http://www.ets16.nl/committees/program-committee
IEEE European Test Symposium. May 23 - 27, 2016. Amsterdam, The Netherlands. Rob Aitken, ARM (US). Jürgen Alt, Intel Germany (DE). Florence Azais, LIRMM (FR). Luz Balado, UPC (ES). Shawn Blanton, CMU (US). Luca Cassano, POLIMI (IT). Abhijit Chatterjee, (US). Wu-Tung Cheng, Mentor (US). Stefano Di Carlo, POLITO (IT). Luigi Dilillo, LIRMM (FR). Goerschwin Fey, U. Bremen (DE). Marie-Lise Flottes, LIRMM (FR). Valentin Gherman, CEA (FR). Emil Gizdarski, Synopsys (US). Dimitris Gizopoulos, U. of Athens (GR).
ets16.nl
Table-Top Demos
http://www.ets16.nl/calls/table-top-demos
IEEE European Test Symposium. May 23 - 27, 2016. Amsterdam, The Netherlands. With higher priority for higher support grades. A submission to the ETS'16 Table-Top Demos should contain a title and an (extended) abstract. Submission deadline: January 30, 2016. Notification of acceptance: February 12, 2016. To submit your proposal. Only electronic submission of PDF files via the paper submission page are accepted. Please contact the Industrial Relations Chairs. Full Corporate Supporters list.
ets16.nl
Evaluation Form
http://www.ets16.nl/evaluation-form
IEEE European Test Symposium. May 23 - 27, 2016. Amsterdam, The Netherlands. Please access the evaluation form here. Upon completion, please show the proof to the registration desk. We award you with a PowerBank (2600mAh) for your efforts. Full Corporate Supporters list. 124; Delft University of Technology. 124; Computer Engineering.
en.wikipedia.org
Automatic test pattern generation - Wikipedia, the free encyclopedia
https://en.wikipedia.org/wiki/Automatic_test_pattern_generation
Automatic test pattern generation. From Wikipedia, the free encyclopedia. Acronym for both A. Enerator) is an electronic design automation. Method/technology used to find an input (or test) sequence that, when applied to a digital circuit. Enables automatic test equipment. The effectiveness of ATPG is measured by the number of modeled defects, or fault models. Detectable and by the number of generated patterns. These metrics generally indicate test quality. The Stuck-at fault model. Fault activation esta...
ets15.ro
ETS'15 Special Sessions deadlines
http://www.ets15.ro/deadlines_ss.html
IEEE European Test Symposium. May 25-29, 2015. February 20, 2015. April 1, 2015. ETS'15 at Technical University of Cluj-Napoca.