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IEEE International Integrated Reliability Workshop (IIRW): Home

International Integrated Reliability Workshop. The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Univ Modena and Reggio Emilia. October 8-12, 2018. Fallen Leaf Lake, CA, USA. July 16, 2018.

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IEEE International Integrated Reliability Workshop (IIRW): Home | iirw.org Reviews

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International Integrated Reliability Workshop. The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Univ Modena and Reggio Emilia. October 8-12, 2018. Fallen Leaf Lake, CA, USA. July 16, 2018.

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IEEE International Integrated Reliability Workshop (IIRW): Home | iirw.org Reviews

https://iirw.org

International Integrated Reliability Workshop. The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Univ Modena and Reggio Emilia. October 8-12, 2018. Fallen Leaf Lake, CA, USA. July 16, 2018.

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Invited Speakers - IEEE International Integrated Reliability Workshop (IIRW)

http://www.iirw.org/program/invited-speakers.html

Automotive system level reliability dependence on semiconductor capabilities and market dynamics. Compact modeling for reliability simulation. SiC Power Device Reliability. Università di Modena e Reggio Emilia. RTN analysis as a tool to link physical device characteristics to electrical reliability in nanoscale devices. Francesco Maria Puglisi received the Ph.D. degree with honor in Information and Communication Technology in 2015 from University of Modena and Reggio Emilia, Italy. During the...He is cur...

2

Technical Program - IEEE International Integrated Reliability Workshop (IIRW)

http://www.iirw.org/program/technical-program.html

IIRW 2016 Tech Program - preliminary.pdf. October 9-13, 2016. Fallen Leaf Lake, CA, USA. July 25, 2016 (Extended). August 22, 2016. Ricki Southwick, IBM. Tom Kopley, Fairchild.

3

Special Interest Groups - IEEE International Integrated Reliability Workshop (IIRW)

http://www.iirw.org/program/special-interest-groups.html

What is a Special Interest Group? A Special Interest Group (SIG) is a collaborative working team focused on one compelling topic of mutual interest. The International Integrated Reliability Workshop (IIRW) offers an excellent atmosphere for members of a SIG to meet face-to-face in an informal setting as well as for the SIG to attract interested individual. SIGs also offer a unique opportunity to extend the experiences and interactions at IIRW. Identifying the Opportunity to Form a SIG. October 9-13, 2016.

4

Patron - IEEE International Integrated Reliability Workshop (IIRW)

http://www.iirw.org/home/patron.html

2016 IIRW CORPORATE PATRONAGE. Help identify your company’s prominence to world’s leading device and circuit reliability experts! Corporate patronage of IIRW ensures the vitality of IIRW for your employees and customers and also serves as a vehicle to better acquaint reliability experts to your company’s prominent role in the semiconductor device industry. Principal Patron ($5,000). All of the benefits of the Major Patron level plus the placement of your corporate logo on the attendee gift.

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Tutorial Program - IEEE International Integrated Reliability Workshop (IIRW)

http://www.iirw.org/program/tutorial-program.html

Atomistic modeling of defects in SiO2 and HfO2 for reliability predictions. Scientific Consultant at Veryst Engineering, Needham, MA. Prior to joining Veryst Engineering, Ms. Hartzell was Director of Engineering for Reliability, Failure Analysis, and Yield at Pixtronix, a wholly owned subsidiary of Qualcomm. She was a Senior Staff Scientist in Reliability and Yield at Analog Devices Micromachined Products Division, and has worked at IBM and Digital Equipment Corporation. In this tutorial an overview will...

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Applied Mechanics Conferences: IEEE International Integrated Reliability Workshop, 16-19 October 2006, Stanford Sierra Camp, Lake Tahoe, CA

http://amconferences.blogspot.com/2006/05/ieee-international-integrated.html

Conferences of interest to the community of Applied Mechanics. Friday, May 26, 2006. IEEE International Integrated Reliability Workshop, 16-19 October 2006, Stanford Sierra Camp, Lake Tahoe, CA. Abstract submission deadline: 14 July 2006. Posted by Zhigang Suo @ 3:25 AM. Get Our RSS Feed. International conference on computational and expe. Finite Element Methods in Engineering and Science . GORDON RESEARCH CONFERENCE: Graduate students fina. Energy Nanotechnology International Conference at.

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Technical Conferences Calendars | IEEE Electron Devices Society

http://eds.ieee.org/eds-meetings-calendars.html

Search IEEE Electron Devices Society. Types of EDS Support - Reference Chart. Types of EDS Support Available. IEEE Conference Tools and Resources. Join IEEE and EDS. Join IEEE and EDS. IEEE Members - Join EDS. There are no results for that filter. Clear the field to filter the results again. C2016 31st Symposium on Microelectronics Technology and Devices (SBMicro). 2016 31st Symposium on Microelectronics Technology and Devices (SBMicro). Belo Horizonte, Brazil. Number of Attendees: 150. 2016 European Con...

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CICFAR - External links

http://www.cicfar.nus.edu.sg/links.htm

Safety and emergency response. In-house developed and commercialised equipment / technologies. Charges for usage of facilities. Application for usage of facilities. Tracking for usage of facilities. Department of Electrical and Computer Engineering. International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). International Symposium for Testing and Failure Analysis. International Conference On Solid State Devices and Materials. IEEE Transactions on Electron Devices.

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News & Events / ATHENIS - athenis-fp7

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Automotive tested high-voltage embedded non-volatile memory integrated SoC. ATHENIS video on YouTube. Watch the ATHENIS project video on YouTube http:/ www.youtube.com/watch? ATHENIS invited presentation at CMOSET 2011. Fraunhofer IISB presented results from their investigations for HV-trench-gate integration in LDMOS processes at the 2011 CMOS Emerging Technologies Workshop ( CMOSET. Held June 15-17, 2011 in Whistler, BC, Canada. ATHENIS presentation at IMW 2011. Held May 22-25, 2011 in Monterey, CA.

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Events & Conferences | IEEE Reliability Society

http://rs.ieee.org/events-and-conferences.html

Search IEEE Reliability Society. Featured Conferences/Call for Papers. Annual Reliability and Maintainability Symposium (RAMS). Tucson, AZ, January 25-28, 2016. IEEE International Reliability Physics Symposium (IRPS). 一 For more information: 2016 IRPS. Pasadena, CA, April 17-21, 2016. Reliability Society Conference Schedule. RS Sponsored (*) and Technically Co-sponsored Conferences. There are no results for that filter. Clear the field to filter the results again. Number of Attendees: 150. C2016 IEEE Int...

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IEEE International Integrated Reliability Workshop (IIRW): Home

International Integrated Reliability Workshop. The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Univ Modena and Reggio Emilia. October 8-12, 2018. Fallen Leaf Lake, CA, USA. July 16, 2018.

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