ingbuero.cz

Ing. Buero s.r.o. - semiconductors testing, burn in, HTRB IGBT, HTRB dynamic, HTGS,IOL, SSLT

Founded 1982 in West Germany to develop test systems for reliability testing of POWER MOS devices with more than 10 years experience in the Semiconductor industry. Moved 1992 to Czech Republic. Our customer are semiconductor factories as well as institutions like VDE. We offer test systems as well as testing of customer devices in our test systems. Our standard test systems for power MOS, IGBT or bipolar devices :. 1 HTRB / HTGS ( High Temperature Reverse Bias / Gate Stress ). Life Test for VDE 0884.

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Ing. Buero s.r.o. - semiconductors testing, burn in, HTRB IGBT, HTRB dynamic, HTGS,IOL, SSLT | ingbuero.cz Reviews

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Founded 1982 in West Germany to develop test systems for reliability testing of POWER MOS devices with more than 10 years experience in the Semiconductor industry. Moved 1992 to Czech Republic. Our customer are semiconductor factories as well as institutions like VDE. We offer test systems as well as testing of customer devices in our test systems. Our standard test systems for power MOS, IGBT or bipolar devices :. 1 HTRB / HTGS ( High Temperature Reverse Bias / Gate Stress ). Life Test for VDE 0884.

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Ing. Buero s.r.o. - semiconductors testing, burn in, HTRB IGBT, HTRB dynamic, HTGS,IOL, SSLT | ingbuero.cz Reviews

https://ingbuero.cz

Founded 1982 in West Germany to develop test systems for reliability testing of POWER MOS devices with more than 10 years experience in the Semiconductor industry. Moved 1992 to Czech Republic. Our customer are semiconductor factories as well as institutions like VDE. We offer test systems as well as testing of customer devices in our test systems. Our standard test systems for power MOS, IGBT or bipolar devices :. 1 HTRB / HTGS ( High Temperature Reverse Bias / Gate Stress ). Life Test for VDE 0884.

INTERNAL PAGES

ingbuero.cz

1

Ing. Buero s.r.o. - download

http://www.ingbuero.cz/download.htm

For viewing PDF file use Adobe Acrobat Reader - www.adobe.com/acrobat. Ing Buero s.r.o. Lozická 129, 190 16 Újezd nad Lesy - Praha 9, Czech republic. Tel/fax : 420 281 971 605. Web : www.ingbuero.cz. E-mail : ingbuero@ingbuero.cz.

2

Ing. Buero s.r.o. - HTRB HV IGBT Systems

http://www.ingbuero.cz/htrb_igbt.htm

For high voltage IGBT devices. This test system fulfil requirements on HTRB systems for high voltage IGBT devices with high reverse power losses. This system is only HTRB equipment with continuous measurement of junction temperature under bias voltage up to 2000V. 4 x 80 DUTs. 50 C to 200 C per chamber. Test boards per chamber :. Possible voltage range :. Separate power supply for each test board. Auto-calibration of each DUT before test. Regulation of test temperatur after Tjunction.

3

Ing. Buero s.r.o. - HTRB/HTGS Systems

http://www.ingbuero.cz/htrb_htgs.htm

HTRB / HTGS TEST SYSTEMS. For standard MOS or IGBT devices. Our test systems fulfil the 4 fundamental requirements on HTRB/HTGS systems for power MOS or IGBT devices. Exact case temperature of DUT independent on reverse power losses of tested devices. Reliable device sockets designed for 200 C. Continous measurement of DUTs to find DUTs with rising leakage current before destruction. Separate power supply foe each test board to run different devices in the same chamber. Number of chambers :. 50 C to 200 C.

4

Ing. Buero s.r.o. - others

http://www.ingbuero.cz/others.htm

Most of our systems are designed for Power devices. But we deliver also test systems for different devices, like schottky diodes , opto couplers or LEDs. For example :. TEST SYSTEMS FOR VDE 0884. Test system for safety testing for opto couplers according to VDE 0884, level I and II. 50 C to 175 C. Input current Id :. Output voltage Vce :. Output current Ice :. PULSE LIFE TEST FOR LEDs. 300 to 1500 DUTs. 0 to 3A, 0 to 5A. 1Hz to 1kHz, 1Hz to 10kHz. Room temperature or 25 C to 100 C. Ing Buero s.r.o.

5

Ing. Buero s.r.o. - semiconductors testing, burn in, HTRB IGBT, HTRB dynamic, HTGS,IOL, SSLT

http://www.ingbuero.cz/index.htm

Founded 1982 in West Germany to develop test systems for reliability testing of POWER MOS devices with more than 10 years experience in the Semiconductor industry. Moved 1992 to Czech Republic. Our customer are semiconductor factories as well as institutions like VDE. We offer test systems as well as testing of customer devices in our test systems. Our standard test systems for power MOS, IGBT or bipolar devices :. 1 HTRB / HTGS ( High Temperature Reverse Bias / Gate Stress ). Life Test for VDE 0884.

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ingbuero.cz

Ing. Buero s.r.o. - semiconductors testing, burn in, HTRB IGBT, HTRB dynamic, HTGS,IOL, SSLT

Founded 1982 in West Germany to develop test systems for reliability testing of POWER MOS devices with more than 10 years experience in the Semiconductor industry. Moved 1992 to Czech Republic. Our customer are semiconductor factories as well as institutions like VDE. We offer test systems as well as testing of customer devices in our test systems. Our standard test systems for power MOS, IGBT or bipolar devices :. 1 HTRB / HTGS ( High Temperature Reverse Bias / Gate Stress ). Life Test for VDE 0884.

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