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JEOL ARM-Owner-Group . Welcome . Freising

JEOL ARM-Owner-Group: Welcome to the JEOL ARM-Owner-Group. The first installation of the JEM-ARM200F was completed in February 2010. Now today, more than 100 units of this Transmission Microscope have been purchased worldwide. And still the JEM-ARM200F is one of the most advanced top performance Transmission Microscopes available.

http://www.jeol-arm.eu/

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JEOL ARM-Owner-Group: Welcome to the JEOL ARM-Owner-Group. The first installation of the JEM-ARM200F was completed in February 2010. Now today, more than 100 units of this Transmission Microscope have been purchased worldwide. And still the JEM-ARM200F is one of the most advanced top performance Transmission Microscopes available.
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JEOL ARM-Owner-Group . Welcome . Freising | jeol-arm.eu Reviews

https://jeol-arm.eu

JEOL ARM-Owner-Group: Welcome to the JEOL ARM-Owner-Group. The first installation of the JEM-ARM200F was completed in February 2010. Now today, more than 100 units of this Transmission Microscope have been purchased worldwide. And still the JEM-ARM200F is one of the most advanced top performance Transmission Microscopes available.

INTERNAL PAGES

jeol-arm.eu jeol-arm.eu
1

JEOL ARM-Owner-Group . Site Notice . Freising

http://www.jeol-arm.eu/arm-owner-group/impressum/index.php

E-Mail / Username *. Phone: 49 8161 9845-0. Fax: 49 8161 9845-100. Publisher of this website:. Phone: 49 8161 9845-0. Fax: 49 8161 9845-100. Internet: www.jeol.de. Dr Siegfried Falch, Akihiro Kobayashi. Registered at the commercial register in Munich. Register-No. HRB 117026. Sales tax identification number:. Responsible for the content:. Responsible for the content of the web-presence "www.jeol.de". Dr Siegfried Falch, managing director of JEOL (Germany) GmbH. K-3D Graphic / Dietmar Kumpf e. K. Normally...

2

JEOL ARM-Owner-Group . Application Experiences with the JEOL-ARM . Freising

http://www.jeol-arm.eu/arm-owner-group/blog/posts/applications.php

E-Mail / Username *. Phone: 49 8161 9845-0. Fax: 49 8161 9845-100. Application Experiences with the JEOL-ARM. Due to the close cooperation with our customers and various projects in research and development, we have acquired a broad range of experience in all aspects of modern analytics and high resolution imaging. To use this function, you must be registered. Please log in with your username and your password. Atomic resolution EELS map. With High Energy Resolution. Of carbon at 80 kV.

3

JEOL ARM-Owner-Group . Password forgotten . Freising

http://www.jeol-arm.eu/arm-owner-group/password-forgotten/index.php

E-Mail / Username *. Phone: 49 8161 9845-0. Fax: 49 8161 9845-100. New password cornfirmation *. Bitte nicht ausfüllen *.

4

JEOL ARM-Owner-Group . Special Events only for ARM-Owners . Freising

http://www.jeol-arm.eu/arm-owner-group/events/index.php

E-Mail / Username *. Phone: 49 8161 9845-0. Fax: 49 8161 9845-100. Special Events only for ARM-Owners. To use this function, you must be registered. Please log in with your username and your password.

5

JEOL ARM-Owner-Group . Welcome . Freising

http://www.jeol-arm.eu/arm-owner-group/index.php

E-Mail / Username *. Phone: 49 8161 9845-0. Fax: 49 8161 9845-100. Welcome to the JEOL ARM-Owner-Group. Here you have the possibility to participate actively in the JEOL ARM-Owner-Group to share tips and experiences. Additionally you have the chance to ask other users questions about the JEOL-ARM and furthermore the wide field of microscopy. To use the community you have to log in.

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jeol.de jeol.de

JEOL - Impressum. Anbieterkennzeichnung - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics/impressum

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

jeol.de jeol.de

JEOL - Inhalt - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics/sitemap

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

jeol.de jeol.de

JEOL - Produkte. Elektronen- und Ionenoptische Systeme. Transmissionselektronenmikroskope (TEM) - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics/produktuebersicht/elektronen-ionenoptische-systeme/transmissionselektronenmikroskope

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

jeol.de jeol.de

JEOL - Produkte. Elektronen- und Ionenoptische Systeme. Transmissionselektronenmikroskope (TEM). ARM (Atomic Resolution Microscopes) Transmissionselektronenmikroskope (TEM) mit bis zu 1.3 MeV Beschleunigungsspannung - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics/produktuebersicht/elektronen-ionenoptische-systeme/transmissionselektronenmikroskope/mev-tem

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

jeol.de jeol.de

JEOL - Solutions for Innovation - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics-en

The Companies - JEOL (Germany) GmbH and JEOL (Skandinaviska) AB. Global Structure - the JEOL Group. Transmission Electron Microscopes (TEM). 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. Scanning Electron Microscopes (SEM). SEM with Thermal Cathode. SEM with Thermal Field Emission Cathode. Electron Beam Microprobe Analyzers (EPMA). JXA-8230 With thermal cathode. JXA-8530F With thermal field emission cathode. JAMP-9500F FE Auger micro probe with 8nm resolution. Focused Ion Beam Systems (FIB). AccuTOF LP LC-...

jeol.de jeol.de

JEOL - Produkte. Elektronen- und Ionenoptische Systeme. Rasterelektronenmikroskope (REM) - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics/produktuebersicht/elektronen-ionenoptische-systeme/rasterelektronenmikroskope

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

jeol.de jeol.de

JEOL - Produkte. Produktübersicht - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics/produktuebersicht/produkte.php

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

jeol.de jeol.de

JEOL - Produkte. Elektronen- und Ionenoptische Systeme. Transmissionselektronenmikroskope (TEM). TEMs mit 200 kV Beschleunigungsspannung - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics/produktuebersicht/elektronen-ionenoptische-systeme/transmissionselektronenmikroskope/200-kv-tem-feg-tem

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

jeol.de jeol.de

JEOL - Solutions for Innovation - (Germany) GmbH and (Skandinaviska) AB

http://www.jeol.de/electronoptics

Digitale Bildanalyse in der Elektronenmikroskopie. EDS Analytik am JEOL Transmissionselektronenmikroskop. JEOL F2 and GATAN: The new world for In-Situ Applications. New Applications and Capabilities for In Situ Electron Microscopy: Heating, Gas and Electrical Biasing. Teilnahmebedingungen and Rechtliche Hinweise. Das Unternehmen - JEOL (Germany) GmbH. Elektronen- und Ionenoptische Systeme. 200 kV TEM / FEG TEM. 300 kV TEM / FEG TEM. REM mit thermischer Kathode. REM mit thermischer Feldemissions-Kathode.

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