METROBOOST.COM

Welcome to MetroBoost, the leading provider of calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing

Provides calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing. 153;, and. Overlay Booster: Analysis Software for Control and Optimization of Lithography Exposure Tools. More about real-time features. More about off-line features. MetroChip: Microscope Calibration Target. Please visit Ted Pella web page. For more details such as information about NIST traceability. MetroCal: Stage Mapping Wafer and More. Wafers can also be used as daily monit...

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Welcome to MetroBoost, the leading provider of calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing | metroboost.com Reviews

<META> DESCRIPTION

Provides calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing. 153;, and. Overlay Booster: Analysis Software for Control and Optimization of Lithography Exposure Tools. More about real-time features. More about off-line features. MetroChip: Microscope Calibration Target. Please visit Ted Pella web page. For more details such as information about NIST traceability. MetroCal: Stage Mapping Wafer and More. Wafers can also be used as daily monit...

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1 Calibration wafer

2 MetroCal

3 MetroChip

4 overlay analysis software

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6 coupons

7 reviews

8 scam

9 fraud

10 hoax

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metroboost,metrocal,metrochip,overlay booster,s flagship products,downloads

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Welcome to MetroBoost, the leading provider of calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing | metroboost.com Reviews

https://metroboost.com

Provides calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing. 153;, and. Overlay Booster: Analysis Software for Control and Optimization of Lithography Exposure Tools. More about real-time features. More about off-line features. MetroChip: Microscope Calibration Target. Please visit Ted Pella web page. For more details such as information about NIST traceability. MetroCal: Stage Mapping Wafer and More. Wafers can also be used as daily monit...

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metroboost.com

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Welcome to MetroBoost, the leading provider of wafers and software products for overlay critical dimension metrology in semiconductor manufacturing

http://www.metroboost.com/products/overlaybooster/FtOBreal.html

For unattended, real-time operation with IVS metrology tools. The material on this page describes the advantages of Overlay Booster analysis software in real-time mode. Off-line features and applications are described elsewhere. Off-line details. This presentation is especially geared towards facilities that currently use IVS metrology tools and employ other analysis packages for overlay optimization in real-time mode. Click on each key product advantage below for details, or view the presentation. Accur...

2

Welcome to MetroBoost, the leading provider of wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing

http://www.metroboost.com/products/index.html

This etched polysilicon wafer is intended for automated CD Metro. Ibration. MetroCal is available in 200mm and 300mm wafer sizes. Benefits of consistent calibration include improved recipe portability, multiple system matching, and long-term single-tool measurement precision. This calibration target is a 20mm by 20mm die from 200mm MetroCal wafers. It is shipped with documentation as shown. MetroChip is available from Ted Pella, Inc., the leading provider of microscopy supplies. Ted Pella web page.

3

MetroCal Application - Stage Map Artifact

http://www.metroboost.com/products/stagemap.html

153; for Stage Mapping. The most widely used application of MetroCal: Artifact for mapping XY stages in metrology tools and electrical test equipment -. Targets on MetroCal wafers can be used for both mapping and stage repeatability tests. Targets are printed on the entire wafer surface area up to 1 mm from the wafer edge. Even the partial fields are printed. The benefit is more coverage on the wafer so that you can map the stage close to the wafer's edge. MetroCal wafer is compatible with heating and co...

4

Welcome to MetroBoost download page. MetroBoost is the leading provider of wafers and software products for overlay critical dimension metrology in semiconductor manufacturing

http://www.metroboost.com/downloads/index.html

Redefining Critical in Critical Dimension Metrology" , Proceedings of SPIE,. Vol 4344, 815 (2001) Download pdf file (230kB). The Importance of Measurement Accuracy in Statistical Process Control" , Proceedings of SPIE,. Vol 3998, 546 (2000). Download pdf file (85kB). MetroCal Brochure Download pdf file (17kB). Documents are available for download as pdf (Portable Document Format) files. To view these files, you will need Adobe Acrobat Reader which is downloadable from Adobe web.

5

Welcome to MetroBoost, the leading provider of wafers and software products for overlay critical dimension metrology in semiconductor manufacturing

http://www.metroboost.com/products/overlaybooster/FtOBoffL.html

The material on this page describes Overlay Booster features and applications in off-line mode only. Real-time features are described elsewhere. Real-time details. Overlay Booster is a Windows-based analysis software for stepper and scanner control in production. All the information the user needs, including vector map and lot or wafer statistics, is displayed on a single screen. Here are some of the things you can do in off-line analysis mode:. Open data files directly, no format conversion is required.

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inspectrology.com

IVS Metrology Systems and Products, New & Certified Rebuilt

http://inspectrology.com/products

The best value in metrology. IVS 185 Metrology System. IVS 185 is manufactured in our Sudbury, Massachusetts USA factory, just a few miles from where it was designed. The IVS 185 is the work horse of CD and Overlay metrology systems. The IVS 185 is the latest generation of the IVS line of CD and Overlay Metrology systems which started with the IVS 100, IVS 120, IVS 130, IVS 135, IVS 155, and IVS 165. 75-200 mm White Light Optical CD and Overlay Metrology for Semiconductor, LED and MEMS. The IVS-185 deliv...

inspectrology.com

Metrology Resources, Articles, Societies & Associates, Inspectrology

http://inspectrology.com/resources

The best value in metrology. Metrology Industry Articles by Inspectrology Engineers. Engineers have contributed to several groundbreaking metrology articles for publication by leading metrology societies and associates. Adopting Semiconductor Metrology to Meet the Challenges of MEMS Manufacturing. Tighter Process Control and Reduced Cycle Times Using Off-line Recipe Setup. Inspectrology engineers have contributed to several groundbreaking metrology articles for SPIE, including:. Is a trade organization o...

eumetrys.com

Inspectrology official partner for IVS System in EUROPE

http://www.eumetrys.com/page-215-partnership.html

Metrology Support Company for a NanoWorld. Optical Metrology System and Support Company at Your Service. Overlay Registration technique needs team work. EUMETRYS is the official representative of INSPECTROLOGY in EUROPE to support the IVS system. Founded in 2008 by a pool of dedicated engineers from the original IVS product line. Is now the IVS system. EUMETRYS was created to support the development of Inspectrology in Europe. And participate to its success. For Europe) and Excellis. From all IVS tools.

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Welcome to MetroBoost, the leading provider of calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing

Provides calibration wafers and software products for overlay and critical dimension metrology in semiconductor manufacturing. 153;, and. Overlay Booster: Analysis Software for Control and Optimization of Lithography Exposure Tools. More about real-time features. More about off-line features. MetroChip: Microscope Calibration Target. Please visit Ted Pella web page. For more details such as information about NIST traceability. MetroCal: Stage Mapping Wafer and More. Wafers can also be used as daily monit...

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