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MunEDA's products and solutions enable customers to reduce the design times of their circuits and to maximize robustness, reliability and yield. MunEDA's solutions are in industrial use by leading semiconductor companies in the areas of communication, computer, memories, automotive, and consumer electronics.

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muneda.com » MunEDA Home | muneda.de Reviews
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MunEDA's products and solutions enable customers to reduce the design times of their circuits and to maximize robustness, reliability and yield. MunEDA's solutions are in industrial use by leading semiconductor companies in the areas of communication, computer, memories, automotive, and consumer electronics.
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3 IP Libraries
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empowering innovation,solutions,robustness verification flow,application cases,see more,webinars,analog design migration,e learning,login ,muneda and distributor net,muneda webex,community,customers,partners and associations,muneda university program
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muneda.com » MunEDA Home | muneda.de Reviews

https://muneda.de

MunEDA's products and solutions enable customers to reduce the design times of their circuits and to maximize robustness, reliability and yield. MunEDA's solutions are in industrial use by leading semiconductor companies in the areas of communication, computer, memories, automotive, and consumer electronics.

INTERNAL PAGES

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1

muneda.com » MunEDA Webinars

http://www.muneda.de/webinars.php?webinars_id=38

Circuit Schematic Migration and IP Porting. Variation Analysis, PVT, Monte Carlo and High-Sigma. Circuit and Sensitivity Analysis. PVT and Corner Analysis. Monte Carlo Statistical Analysis 3-5 sigma. High Sigma and Worst Case Analysis 6-9 sigma plus. Circuit Sizing for Low Power, Yield and Reliability. Performance and Corner based Sizing and Tuning. Variation, Sigma and Yield based Sizing and Tuning. Reliability and Aging based Sizing and Tuning. High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA).

2

muneda.com » MunEDA User Group Meetings

http://www.muneda.de/mugm.php?mugm_id=19

Circuit Schematic Migration and IP Porting. Variation Analysis, PVT, Monte Carlo and High-Sigma. Circuit and Sensitivity Analysis. PVT and Corner Analysis. Monte Carlo Statistical Analysis 3-5 sigma. High Sigma and Worst Case Analysis 6-9 sigma plus. Circuit Sizing for Low Power, Yield and Reliability. Performance and Corner based Sizing and Tuning. Variation, Sigma and Yield based Sizing and Tuning. Reliability and Aging based Sizing and Tuning. High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA).

3

muneda.com » MunEDA WiCkeD

http://www.muneda.de/solutions_migration.php

Tools for Circuit Migration and IP Porting. Tools for Circuit Migration and IP Porting" /. Circuit Schematic Migration and IP Porting. Variation Analysis, PVT, Monte Carlo and High-Sigma. Circuit and Sensitivity Analysis. PVT and Corner Analysis. Monte Carlo Statistical Analysis 3-5 sigma. High Sigma and Worst Case Analysis 6-9 sigma plus. Circuit Sizing for Low Power, Yield and Reliability. Performance and Corner based Sizing and Tuning. Variation, Sigma and Yield based Sizing and Tuning. MunEDA User Gr...

4

muneda.com » MunEDA Home

http://www.muneda.de/index.php

Circuit Schematic Migration and IP Porting. Variation Analysis, PVT, Monte Carlo and High-Sigma. Circuit and Sensitivity Analysis. PVT and Corner Analysis. Monte Carlo Statistical Analysis 3-5 sigma. High Sigma and Worst Case Analysis 6-9 sigma plus. Circuit Sizing for Low Power, Yield and Reliability. Performance and Corner based Sizing and Tuning. Variation, Sigma and Yield based Sizing and Tuning. Reliability and Aging based Sizing and Tuning. High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA).

5

muneda.com » MunEDA Partners

http://www.muneda.de/partners.php

Circuit Schematic Migration and IP Porting. Variation Analysis, PVT, Monte Carlo and High-Sigma. Circuit and Sensitivity Analysis. PVT and Corner Analysis. Monte Carlo Statistical Analysis 3-5 sigma. High Sigma and Worst Case Analysis 6-9 sigma plus. Circuit Sizing for Low Power, Yield and Reliability. Performance and Corner based Sizing and Tuning. Variation, Sigma and Yield based Sizing and Tuning. Reliability and Aging based Sizing and Tuning. High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA).

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Circuit Schematic Migration and IP Porting. Variation Analysis, PVT, Monte Carlo and High-Sigma. Circuit and Sensitivity Analysis. PVT and Corner Analysis. Monte Carlo Statistical Analysis 3-5 sigma. High Sigma and Worst Case Analysis 6-9 sigma plus. Circuit Sizing for Low Power, Yield and Reliability. Performance and Corner based Sizing and Tuning. Variation, Sigma and Yield based Sizing and Tuning. Reliability and Aging based Sizing and Tuning. High Sigma for Memory Design (SRAM, DRAM, Flash, FPGA).

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