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siliconyield.com

Yield Learning on the newest ideas on the smallest technologies

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Chris Schuermyer

9750 S●●●●●●th Ave

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siliconyield.com | siliconyield.com Reviews
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Yield Learning on the newest ideas on the smallest technologies
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1 siliconyield com
2 leave a comment
3 posted in defects
4 design rule checking
5 antennae effects
6 plasma etch/deposition
7 design for manufacturing
8 diagnosis
9 failure analysis
10 foundry/fabless
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Yield Learning on the newest ideas on the smallest technologies

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Scan Diagnosissiliconyield.com | siliconyield.com

http://siliconyield.com/tag/scan-diagnosis

Yield Learning on the newest ideas on the smallest technologies. All posts tagged scan diagnosis. Exploring Yield Learning Using Tester Data. Posted by Chris Schuermyer. On January 23, 2012. Posted in: Yield Analysis. Is intended to minimize the impact of collecting data for logic diagnosis and for memory bitmapping. Another sign of the times is the widespread adoption of STDF v4-2007. Curiously also available as an incredibly boring ebook. If you’re interested. View full article for. On January 1, 2012.

2

Diagnosis | siliconyield.com

http://siliconyield.com/category/diagnosis-2

Yield Learning on the newest ideas on the smallest technologies. 4 Ways to Securely Communicate Diagnosis Data Between Foundry and Fabless. Posted by Chris Schuermyer. On January 10, 2013. In the past decade there has been a widespread transition of semiconductor companies going from Integrated Device Manufacturers (IDM) to Fabless. The reasons for this are many but include:. Cost of a state-of-the-art fab exceeds US $1 Billion. GLOBALFOUNDRIES Fab 8 will cost almost US $8 Billion. When things are runnin...

3

Exploresiliconyield.com | siliconyield.com

http://siliconyield.com/tag/explore

Yield Learning on the newest ideas on the smallest technologies. All posts tagged explore. Exploring Yield Learning Using Tester Data. Posted by Chris Schuermyer. On January 23, 2012. Posted in: Yield Analysis. Is intended to minimize the impact of collecting data for logic diagnosis and for memory bitmapping. Another sign of the times is the widespread adoption of STDF v4-2007. Curiously also available as an incredibly boring ebook. If you’re interested. View full article for. Subscribe to Blog via RSS.

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Gate Oxide Defects Caused by Antenna Effectssiliconyield.com | siliconyield.com

http://siliconyield.com/gate-oxide-defects-caused-by-antenna-effects

Yield Learning on the newest ideas on the smallest technologies. Gate Oxide Defects Caused by Antenna Effects. Posted by Chris Schuermyer. On January 17, 2013. Gate oxide defects, sometimes called pinholes, have long been a meddlesome source of yield loss in semiconductor manufacturing. Oxide weaknesses also have the ability to degrade over time, which means they can be a reliability issue in addition to a yield issue. Gate oxide defects generally come about from the combination of:. Weakness of the gate.

5

Exploring Yield Learning Using Tester Datasiliconyield.com | siliconyield.com

http://siliconyield.com/exploring-yield-learning-using-tester-data

Yield Learning on the newest ideas on the smallest technologies. Exploring Yield Learning Using Tester Data. Posted by Chris Schuermyer. On January 23, 2012. Posted in: Yield Analysis. Is intended to minimize the impact of collecting data for logic diagnosis and for memory bitmapping. Another sign of the times is the widespread adoption of STDF v4-2007. Curiously also available as an incredibly boring ebook. If you’re interested. Traditional Yield Management Systems (YMS). PDF Solutions’ dataPOWER. In ge...

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Yield Learning on the newest ideas on the smallest technologies. Overkill: 5 Examples of the Best Type of Yield Loss. Posted by Chris Schuermyer. On May 22, 2013. Posted in: Yield Analysis. Overkill is when a perfectly good die fails testing on an ATE even though it is a functioning part. This is the best type of yield loss because the yield can be recovered almost immediately, without modifying the design or changing anything in the fab. Die are thrown away that could otherwise be sold (duh! Gate oxide ...

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