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spectroscopicellipsometry.com

FilmTek™ | Spectroscopic Ellipsometry (SE)

Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.

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Gaertner Scientific Corp

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Gaertner Scientific Corp

R. J. KUTKO

3650 ●●●●●s Ave

Sk●●ie , Illinois, 60076

United States

1.84●●●●5006
1.84●●●●5009
ru●●●@gaertnerscientific.com

View this contact

Gaertner Scientific Corp

R. J. KUTKO

3650 ●●●●●s Ave

Sk●●ie , Illinois, 60076

United States

1.84●●●●5006
1.84●●●●5009
ru●●●@gaertnerscientific.com

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FilmTek™ | Spectroscopic Ellipsometry (SE) | spectroscopicellipsometry.com Reviews
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Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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KEYWORDS
1 ellipsometry
2 ellipsometer
3 ellipsometers
4 spectroscopic ellipsometry
5 spectroscopic ellipsometer
6 SE
7 thin film thickness
8 multiwavelength ellipsometer
9 reflectometry
10 reflectometer
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FilmTek™ | Spectroscopic Ellipsometry (SE) | spectroscopicellipsometry.com Reviews

https://spectroscopicellipsometry.com

Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.

INTERNAL PAGES

spectroscopicellipsometry.com spectroscopicellipsometry.com
1

Wafer Manufacturing - Scientific Computing International

http://spectroscopicellipsometry.com/products/wafer-manufacturing

Advanced Packaging & TSV. Photonics & Telecom. Thin Film Design Software. Multi-angle Reflectometry & Ellipsometry. Delivers rapid and accurate wafer geometry characterization to enable wafer manufacturers to meet the demanding lithography and CMP requirements imposed by 1X nm design rules and beyond. Obtains high-throughput measurements of stress-induced wafer shape changes, shape-induced overlay, wafer thickness variation and front- and back-side topography. Advanced Packaging & TSV.

2

Application Notes - Scientific Computing International

http://spectroscopicellipsometry.com/resources/application-notes

Advanced Packaging & TSV. Photonics & Telecom. Thin Film Design Software. Multi-angle Reflectometry & Ellipsometry. Advanced Packaging and TSV Application Reports. Through Silicon Via (TSV) Metrology. Critical Dimension, Etch Depth, and Film Thickness Measurement. Characterizing Graphene with Multi-Angle Reflectometry and Ellipsometry. Characterizing Oxide Films for Waveguide Applications. Characterizing Film Properties versus Temperature. Characterizing Phase Change Materials: GeSbTe (GST).

3

Measurement Services - Scientific Computing International

http://spectroscopicellipsometry.com/measurement-services

Advanced Packaging & TSV. Photonics & Telecom. Thin Film Design Software. Multi-angle Reflectometry & Ellipsometry. FilmTek metrology systems can measure a broad array of single and multi-layer films including metallic, semiconductor, amorphous, crystalline, and dielectric materials on virtually any substrate. FilmTek systems can simultaneously determine:. Multiple layer thicknesses (from 1Å to 250 microns). Indices of refraction [ n(λ) ] (both TE and TM components of index). Energy band gap [ E.

4

FilmTek 2000 PAR-SE - Scientific Computing International

http://spectroscopicellipsometry.com/product/filmtek-2000-par-se

Advanced Packaging & TSV. Photonics & Telecom. Thin Film Design Software. Multi-angle Reflectometry & Ellipsometry. Spectroscopic Ellipsometry and DUV Multi-Angle Polarized Reflectometry. The FilmTek 2000 PAR-SE combined metrology line is our most advanced benchtop metrology solution, with the highest accuracy, precision, and versatility in the industry. The FilmTek 2000 PAR-SE was engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production. Combining pat...

5

Resources - Scientific Computing International

http://spectroscopicellipsometry.com/resources

Advanced Packaging & TSV. Photonics & Telecom. Thin Film Design Software. Multi-angle Reflectometry & Ellipsometry. This is an example page. It’s different from a blog post because it will stay in one place and will show up in your site navigation (in most themes). Most people start with an About page that introduces them to potential site visitors. It might say something like this:. 8230;or something like this:. As a new WordPress user, you should go to your dashboard.

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SDI Home

Spectroscopic Diagnostics, Inc. SDI is a small and dynamic engineering corporation engaged in R&D project work and technical consulting services. In business for. 10 years, SDI serves a broad US and international customer base operating in the educational, research and commercial arenas. SDI specialties include but are not limited to the following:. SDI offers a full spectrum of services including detailed analysis, designing and building prototype instruments. SDI is the. Doing something about that!

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spectroscopic in a sentence | simple examples

In A Sentence .org. The best little site that helps you understand word usage with examples. Spectroscopic in a sentence. I was thinking more of. Thats a great post, and yes, I was certainly working under the assumption that a nuclear explosion would have a distinct. Signature when compared to the emissions of our Sun. I've got the impression that. Methods that would be able to detect the major composition of the atmospheres of exoplanets at 10 100 light years away, are almost around a corner now. If I'm...

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FilmTek™ Spectroscopic Ellipsometers

SCI provides high resolution thin-film metrology systems to leading companies in the semiconductor, optoelectronics, data storage, display, MEMS, biotechnology, photovoltaic, and optical coating industries. FilmTek spectroscopic ellipsometers are based on a rotating compensator design and combine spectroscopic ellipsometry with multi angle reflectometry to provide peak performance from very-thin to very-thick films. FilmTek spectroscopic ellipsometers accurately determine film thickness, refractive i...

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FilmTek™ | Spectroscopic Ellipsometry (SE)

Advanced Packaging & TSV. Photonics & Telecom. Thin Film Design Software. Multi-angle Reflectometry & Ellipsometry. SCI’s expanding technology portfolio is focused on meeting tomorrow’s most critical metrology needs. To meet these demands, SCI engineers multi-modal metrology solutions, encompassing multi-angle spectroscopic ellipsometry, reflectometry, transmission, and scatterometry. We are dedicated to building custom solutions to solve our customers’ most pressing challenges.

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Analyzer Solutions - Home

Contact / About Us. Analyzers for Safety, Security, and Compliance. Click to see demonstration video. At Analyzer Solutions we are committed to providing our customers with affordable solutions for product safety, security, and compliance. Our products are based on our many years of experience doing spectroscopy consulting in numerous industry verticals, numerous patents and trade secrets. Our analyzers are made in the USA. The Denali Raw Material Analyzer.

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Spectroscopy shop

Welcome, Log in. Dual Gas Vacuum Flow kit. Golden Gate reflectance ATR. P-E Sealed Liquid transmission Cells. Circular Sealed liquid transmission cell. Liquid sandwich transmission cells. Variable Temperature and Pressure cells. 250C Solid and liquid Cell. Transmission Cryogenic Jacket Cell. 190 to 250C solid, liquid gas cell. Transmission Heating Jacket Cell. 250C Multipurpose Solid, Liquid, Gas Cell. 800C/1000psi solid, liquid, Gas cell. Dual Gas Vacuum Flow kit. High Pressure Liquid Cell. And if you n...

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LabCognition

Spectrum Processing, Evaluation and Scientific Search. Reaction Monitoring and Trend Analysis. IR and Raman Expert Tools. Web-based Scientific Information System. Apps for Smartphones and Tablets. Spectroscopy in the Cloud. Data Management and Reporting. Security, GxP and Part 11 Compliance. SciGear Scientific Information System. Panorama - Spectroscopy Software Environment. OEM Applications and Branding. Custom Workflows and Automation. How to register my Product? Panorama Online Software Help. All prod...