Information about short courses in surface analysis, Auger electron spectroscopy, x-ray photoelectron spectroscopy, depth profiling, AES, XPS, ESCA, SIMS, SNMS, ISS, SIA, surface and interface analysis, consulting, training
http://www.surfaceanalysis.org/
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John Grant
1301 Sher●●●●●●●●●est Drive
Da●●on , OH, 45449-2249
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John Grant
1301 Sher●●●●●●●●●est Drive
Da●●on , OH, 45449-2249
US
View this contact
John Grant
1301 Sher●●●●●●●●●est Drive
Da●●on , OH, 45449-2249
US
View this contact
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Surface Analysis - John T. Grant | surfaceanalysis.org Reviews
https://surfaceanalysis.org
Information about short courses in surface analysis, Auger electron spectroscopy, x-ray photoelectron spectroscopy, depth profiling, AES, XPS, ESCA, SIMS, SNMS, ISS, SIA, surface and interface analysis, consulting, training
surfaceanalysis.org
Surface Analysis by Auger and X-ray Photoelectron Spectroscopy
http://www.surfaceanalysis.org/BriggsGrant.html
Surface Analysis by Auger and X-ray Photoelectron Spectroscopy. Edited by D. Briggs and J.T. Grant. Perspectives on XPS and AES: Dave Briggs and John Grant. XPS: Basic Principles, Spectral Features and Qualitative Analysis: Dave Briggs. AES: Basic Principles, Spectral Features and Qualitative Analysis: John Grant. Specimen Preparation and Handling: Joe Geller. XPS: Instrumentation and Performance: Ian Drummond. AES: Instrumentation and Performance: Masato Kudo. Electron Attenuation Lengths: Shigeo Tanuma.
The XPS Database of Polymers
http://www.surfaceanalysis.org/polymer_database.html
Edited by Graham Beamson and David Briggs. The CD version of ' High Resolution XPS of Organic Polymers - The Scienta ESCA300 Database. By the same editors. Wide scan survey, narrow scan and valence band spectra from 111 pure polymers. Raw data available on CD in VAMAS/MultiPak/ASCII formats. US$550.00 outside the UK. UK 300.00 in the UK. Ordering information: Contact John Grant. RETURN TO Home Page.
CURRENTLY SCHEDULED SHORT COURSES:
http://www.surfaceanalysis.org/schedule.html
NOTE: In-house or on-site short courses or training on XPS/ESCA, AES, and CasaXPS can be scheduled at your facility at any time. Contact me. Click here for SHORT COURSE DESCRIPTIONS. 6-10 February 2017, Tampa, Florida. This five-day set of short courses will be devoted to Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS/ESCA) and the processing of their spectra. These courses are designed for scientists, engineers, technicians, and students, who would like a detailed understand...
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surfaceanalysis.co.uk
surfaceanalysis.group.shef.ac.uk
SSAC: Sheffield Surface Analysis Centre
Graham.leggett@shef.ac.uk. Welcome to Sheffield Surface Analysis Centre. The SSAC is a facility based within the University of Sheffield providing access to state of the art surface analysis instrumentation for both commercial and academic research. In addition to our Axis Ultra DLD (XPS) and TOF.SIMS. We have facilities for carrying out atomic force microscopy (AFM), spectroscopic ellipsometry and contact angle goniometry. Techniques available in the SSAC allow us to determine:.
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Surface Analysis - John T. Grant
John T. Grant. XPS/ESCA, AES, and CasaXPS Training. XPS of Polymers Database on. CasaXPS Data Processing Software. Courses can be selected from the following list, or tailored to your needs. 1 Auger Electron Spectroscopy. 2 Auger Electron Spectroscopy and Data Processing. 3 X-Ray Photoelectron Spectroscopy (XPS/ESCA). 4 X-Ray Photoelectron Spectroscopy (XPS/ESCA) and Data Processing. 5 Data Processing in AES and XPS/ESCA. 6 CasaXPS Training Course. On-site courses and training. Purchase licenses for Casa...
Анализ Поверхности - Главный источник информации по исследованиям топографии и химического состава поверхности
Стекла и оптические компоненты. Средства для хранения данных. Всё возрастающий интерес к исследованиям свойств структуры и состава поверхности твёрдых тел стимулирует как развитие традиционных методов и технологий, так и разработку новых подходов к анализу поверхности. Свойства и реакционная способность поверхности зависят от:. Электронного состояния, химических связей;. EDX, WDX, EBSD, LEED, EELS, MFM. Выступление профессора Hidde Brongersma в университете Lehigh University (март 2011). Вышеприведенный ...
SPECS GmbH Systems and Components for Surface Analysis and Nanotechnology
SPECS GmbH Systems and Components for Surface Analysis and Nanotechnology.
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Surface Analytics
