icdt.ece.pdx.edu
TestSelfStudy - Integrated Circuits Design and Test Laboratory
http://icdt.ece.pdx.edu/~icdt/cgi-bin/index.cgi/TestSelfStudy
Integrated Circuits Design and Test Laboratory. Revert to this revision. Has research and education missions. The research agenda. Is most generally described as defect-based screening for deep-submicron technologies. The research is sub-divided into focus areas. Data Driven Test Flow. The education mission has a local component and a community component. The local. Component is designed for the graduate students working in the laboratory. Each. Is an integral part of this process. Research in this area ...
en.wikipedia.org
Automatic test pattern generation - Wikipedia, the free encyclopedia
https://en.wikipedia.org/wiki/Automatic_test_pattern_generation
Automatic test pattern generation. From Wikipedia, the free encyclopedia. Acronym for both A. Enerator) is an electronic design automation. Method/technology used to find an input (or test) sequence that, when applied to a digital circuit. Enables automatic test equipment. The effectiveness of ATPG is measured by the number of modeled defects, or fault models. Detectable and by the number of generated patterns. These metrics generally indicate test quality. The Stuck-at fault model. Fault activation esta...
testplaza.fujiwaralab.net
Call for Papers - TEST PLAZA
http://testplaza.fujiwaralab.net/en/cfp
Asia and Pacific Regional TTTC, IEEE CS. Asian Test Symposia, IEEE. 10th Asian Test Symposium, ATS'01. 11th Asian Test Symposium, ATS'02. 12th Asian Test Symposium, ATS'03. 13th Asian Test Symposium, ATS'04. 14th Asian Test Symposium, ATS'05. 15th Asian Test Symposium, ATS'06. 16th Asian Test Symposium, ATS'07. 17th Asian Test Symposium, ATS'08. 18th Asian Test Symposium, ATS'09. 19th Asian Test Symposium, ATS'10. 1st Asian Test Symposium, ATS'92. 20th Asian Test Symposium, ATS'11. 9th Workshop on RTL an...
sdd.tttc-events.org
Silicon Debug & Diagnosis 2008
http://sdd.tttc-events.org/08/index.html
5th IEEE International Workshop on. Silicon Debug and Diagnosis - SDD08. San Diego, California, USA. Held in conjunction with the IEEE VLSI Test Symposium 2008. F Muradali - National Semi. B Vermeulen - NXP Semi. M Ricchetti - AMD. T McLaurin - ARM. K Hatayama - STARC. D Appello - STMicroelectronics. N Nicolici - McMaster Univ. I Harris - UC Irvine. I Bayraktaroglu - Sun. M Abramovici - DAFCA. C Boit - TU Berlin. R Guo - Mentor Graphics. B Cory - nVidia. A Crouch - Inovys. B Eklow - Cisco. S Gupta - USC.
testplaza.fujiwaralab.net
Calendar - TEST PLAZA
http://testplaza.fujiwaralab.net/en/calendar
Asia and Pacific Regional TTTC, IEEE CS. Asian Test Symposia, IEEE. 10th Asian Test Symposium, ATS'01. 11th Asian Test Symposium, ATS'02. 12th Asian Test Symposium, ATS'03. 13th Asian Test Symposium, ATS'04. 14th Asian Test Symposium, ATS'05. 15th Asian Test Symposium, ATS'06. 16th Asian Test Symposium, ATS'07. 17th Asian Test Symposium, ATS'08. 18th Asian Test Symposium, ATS'09. 19th Asian Test Symposium, ATS'10. 1st Asian Test Symposium, ATS'92. 20th Asian Test Symposium, ATS'11. 9th Workshop on RTL an...
proactive.vt.edu
PROACTIVE
http://www.proactive.vt.edu/download.html
STRATEGATE Sequential ATPG Executable Download. STRATEGATE sequential ATPG download. Automatic Validation Stimuli Generator Executable Download. Automatic Validation Stimuli Generator download. BEACON design validation files. Safety Properties and vectors. General Safety Property Benchmarks. ISCAS85 combinational benchmark circuits. ISCAS89 sequential benchmark circuits. ISCAS93 addendum sequential benchmark circuits. High-level (Verilog) models for ISCAS Circuits. High-level synthesis benchmark circuits.