ellip-cmmp.blogspot.com
CMMP Ellipsometry: Gaertner Ellipsometer
http://ellip-cmmp.blogspot.com/2011/06/gaertner-ellipsometer.html
Friday, June 17, 2011. The CMMP group at the Florida State University Department of Physics has a Gaertner L116B ellipsometer that is available to the local research community. There are no fees for use of this instrument. Fast; non-contact; cost; ideal for Si oxides and nitrides; ideal for materials with well known optical properties for HeNe visible radiation. Subscribe to: Post Comments (Atom). View my complete profile. CMMP Scanning Electron Microscopy. CMMP Scanning Probe Microscopy.
overview-cmmp.blogspot.com
CMMP User Facilities: October 2014
http://overview-cmmp.blogspot.com/2014_10_01_archive.html
Wednesday, October 1, 2014. Because of staffing limitations at the CMMP facility, services requiring CMMP staff may involve some delay as instruments and staff time become available. In general, services are provided on a first-come, first server basis. This rule is subject to the discretion of the facility manager according to the availability of instrumentation, staffing, etc. The entries in italics. Are set as high priority, and the projects in red. Are either currently underway or scheduled.
overview-cmmp.blogspot.com
CMMP User Facilities: June 2013
http://overview-cmmp.blogspot.com/2013_06_01_archive.html
Sunday, June 30, 2013. Users of the CMMP facilities are requested to recognize the Florida State University Department of Physics Condensed Matter and Material Physics (CMMP) user facility in publications using this lab as a resource. While journal article co-authorship is not required to use the CMMP facilities, please consider offering co-authorship to CMMP staff contributing beyond the scope of routine instrument training and consultation. Subscribe to: Posts (Atom). View my complete profile.
overview-cmmp.blogspot.com
CMMP User Facilities: Introduction
http://overview-cmmp.blogspot.com/2012/04/introduction.html
Friday, July 5, 2013. Vibrating sample magnetometry, dielectric spectroscopy. And PPMS for magneto-transport measurements. Scanning electron microscopy (SEM with EDS). Scanning probe microscopy (SPM). X-ray photoelectron spectroscopy (XPS). Scanning probe microscopy (SPM). Evaporation, sputtering, UHV sputtering. Dip-pen nanolithography (DPN), photolithography, e-beam lithography, wet etching, reactive ion etching (RIE), ion milling, plasma etching, wire bonder, class 1000 cleanroom.
prof-cmmp.blogspot.com
CMMP Profilometry: July 2011
http://prof-cmmp.blogspot.com/2011_07_01_archive.html
Thursday, July 7, 2011. It will appear as if there is stylus instability. Subscribe to: Posts (Atom). I manage the analytical and fabrication tools in the Condensed Matter and Materials Physics (CMMP) group at Florida State University. Please contact me directly at lochner@cmmp.fsu.edu for information about using any of these research tools. View my complete profile. CMMP Scanning Electron Microscopy. CMMP Scanning Probe Microscopy. CMMP X-ray Photoelectron Spectroscopy.
prof-cmmp.blogspot.com
CMMP Profilometry: Alpha Step 200
http://prof-cmmp.blogspot.com/2011/06/alpha-step-200.html
Friday, June 10, 2011. The CMMP group at the Florida State University Department of Physics has a Tencor AlphaStep 200 scanning profilometer that is available to the local research community. There are no fees for use of this instrument. The scanning profilometer is a complement to SEM. Scanning electron microscopy) and SPM. Fast; very large scan lengths; very large vertical depths; good vertical resolution when lateral resolution is not needed; cost. Maximum Scan Length: 10,000 um. Stylus Force: 1-25 mg.
prof-cmmp.blogspot.com
CMMP Profilometry: Stylus Stability Test
http://prof-cmmp.blogspot.com/2011/07/stylus-stability-test.html
Thursday, July 7, 2011. It will appear as if there is stylus instability. Subscribe to: Post Comments (Atom). I manage the analytical and fabrication tools in the Condensed Matter and Materials Physics (CMMP) group at Florida State University. Please contact me directly at lochner@cmmp.fsu.edu for information about using any of these research tools. View my complete profile. CMMP Scanning Electron Microscopy. CMMP Scanning Probe Microscopy. CMMP X-ray Photoelectron Spectroscopy.
prof-cmmp.blogspot.com
CMMP Profilometry: Current Calibration
http://prof-cmmp.blogspot.com/2011/06/current-calibration.html
Monday, June 20, 2011. Using a 9429 A standard, it is 0.06% off on the kA scale and -0.31% off on the um scale. Using a 1.74 um standard, it is 0.40% off on the kA scale and 1.15% off on the um scale. Using a 23.13 um standard, it is -0.95% on the um scale. Subscribe to: Post Comments (Atom). View my complete profile. CMMP Scanning Electron Microscopy. CMMP Scanning Probe Microscopy. CMMP X-ray Photoelectron Spectroscopy. Simple template. Powered by Blogger.
overview-cmmp.blogspot.com
CMMP User Facilities: September 2014
http://overview-cmmp.blogspot.com/2014_09_01_archive.html
Tuesday, September 30, 2014. The CMMP Authorization form is a form to satisfy the grant compliance concerns of federal funding agencies such as NSF, DOE, etc., and is a requirement of the FSU contracts and grants compliance officers. The Project ID prevents users from having to actually enter Department ID, Fund, Project, CF1, and CF2 fields into instrument logs. The authorization form in PDF format. Can be obtained from our CMMP server. The top is PI information. The body of the form has budget informat...
